arXiv preprint ·
Morphology-Aware Ambiguity Learning for Wafer Defect Decision Support
- Published
- Source
- arXiv preprint, posted before peer review
- Original
- Read it at arXiv
- Topics
Abstract
Wafer map defect recognition is commonly formulated as a fixed-taxonomy classification problem that assigns each wafer to a single defect class. However, some wafers exhibit morphologies near class boundaries, for which forcing a single prediction may be less informative than providing plausible diagnostic alternatives. This paper proposes a morphology-aware ambiguity learning framework that supports three diagnostic actions: automatic single-class diagnosis, assisted diagnosis with two plausible defect classes, and full review. Using the radial, angular, and geometric characteristics of training wafer maps, the framework constructs a class-level ambiguity matrix representing defect-class pairs with similar morphology and plausible diagnostic alternatives. It guides the model to learn plausible alternative classes rather than treating all incorrect classes equally. During inference, the matrix determines whether an uncertain prediction can be represented by a meaningful two-class diagnostic set or should be escalated for full review. Experiments on WM-811K show that the proposed framework outperforms conventional approaches in defect recognition and diagnostic decision support, providing meaningful two-class alternatives while reserving full review for cases with unresolved ambiguity. Illustrative cost analyses further show the potential cost advantage of the proposed routing strategy. The diagnostic behavior of the framework remains consistent across different backbone architectures.
The authors’ abstract, as arXiv lists it. arXiv’s listings, abstracts included, are free for anyone to reuse.
Read it on ReadSearch
Each opens after you create an account, and brings you back to this paper.
More in Computer Vision
Adaptive Color Grading
PanoSeg3R: Feed-Forward 3D Semantic Segmentation for Panoramic Images with an Automatic Data Curation Pipeline
4DGS-Fixer: Generative Sparse-View 4D Gaussian Splatting with Iterative Refinement Guided by Video Diffusion Priors
Vision2CAD: A Visual Agent Harness for Explicit Geometry Referencing and Localization in Parametric CAD Modeling
Robust Structureless Monocular Visual Inertial Initialization Exploiting Line Features and Vanishing Points
Get the few papers worth your time in Computer Vision every morning.
ReadSearch reads the new papers in your field each day and brings you the few worth reading, each with its key finding in a sentence.