arXiv preprint ·
A benchmark dataset and baseline methods for four-dimensional STEM diffraction patterns
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Abstract
Four-dimensional scanning transmission electron microscopy (4D-STEM) records a two-dimensional diffraction pattern at each electron-probe position, yielding spatially resolved reciprocal-space information but large, heterogeneous data volumes. Here we describe 4D-ImageNet, a collection of 174,000 diffraction patterns comprising 145,000 experimental patterns selected from 29 acquisitions and 29,000 multislice simulations. The experimental data cover acquisition-level labels for Ag, Au, mixed Au-Ag, CoO, Pd and ZnO specimens across multiple fields of view, scan dimensions, camera lengths and exposure times. Each acquisition contributes 5,000 quality-ranked patterns with source scan coordinates and acquisition metadata. A set-prediction detector provides model-derived pseudo-labels for the direct-beam position and Bragg-disk centres, with a confidence score for each disk. The simulation data cover 13 crystal structures and include Euler rotations, reciprocal-space sampling and approximate low-index beam directions. A grouped mixed-domain masked-reconstruction benchmark is provided to assess leakage-resistant loading and evaluation across experimental and simulated data. The dataset is intended for representation learning, disk detection, diffraction-pattern retrieval, orientation analysis and simulation-to-experiment studies.
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